Used KLA / TENCOR / PROMETRIX P-20H #9151984 for sale

KLA / TENCOR / PROMETRIX P-20H is a wafer testing and metrology equipment designed for precision probing, metrology, and other applications. This system offers high accuracy, repeatability, and includes several features that enable advanced automation of wafer testing. KLA P-20H is a dual-head metrology and testing unit which utilizes a load/unload robot as well as vacuum wafer handling technology. It is powered by a general purpose computer with an Intel core processor, Windows 10 Pro operating machine, and a graphical user interface for ease of operation. The tool also includes a specialized data acquisition board which is capable of measuring and analyzing different types of signals being generated through wafer testing and metrology processes. The asset features a multi-scann ing head which allows for quick and precise probing of test structures, along with supporting a range of wafer types. It is also capable of both low current and high voltage scanning, enabling probing of a wide range of wafer features and geometries. TENCOR P20H utilizes the LAQuarVIS imaging model which combines the use of a linear imaging module and high accuracy stage motion to provide both high accuracy and repeatability of results. This equipment is designed with a number of automated functions, including automatic alignment, reference measurements, and automated capture of data. P20H is also integrated with the ProberLink software package which allows for easy integration of wafer probes into automated test systems. This software also provides easy viewing, timing, and analysis of wafer test data. Finally, PROMETRIX P20H has the ability to store a variety of test parameters, allowing for the generation of repeatable and reliable results. Overall, KLA / TENCOR / PROMETRIX P20H wafer testing and metrology system is an ideal solution for advanced probing, metrology, and automation of wafer testing processes. With its high accuracy, repeatability, and automated functions, KLA P20H makes it easy to conduct a variety of wafer testing tasks with ease and precision.