Used KLA / TENCOR / PROMETRIX P16 #9358967 for sale

KLA / TENCOR / PROMETRIX P16 is a advanced wafer testing and metrology equipment designed to deliver comprehensive and accurate data on a variety of wafer and die characteristics. Utilizing a unique optical signal acquisition system (KLA OptiTrac), KLA P16 offers a variety of high-resolution analysis capabilities, including edge qualification, thin film metrology, defect inspection, process control, and particle size metrology. TENCOR P-16's OptiTrac unit incorporates a combination of four advanced detection and capture technologies: kinematic scanning, dynamic scanning, dual-beam imaging, and precision imaging. The machine can simultaneously acquire many optical signals including micron-scale film thickness details, as well as precise particle size and defect detection across a wide range of samples. This provides extensive data sets for accurate defect characterization and process control. PROMETRIX P16 integrates a large sample to sample area for 100 millimeter wafers, as well as three optical modules for standard inspection and metrology operations. Furthermore, the tool includes an advanced microscope module, which enables high-resolution imaging of defect features, particles, dopants, and penetrating physical films. In addition, P16 includes a unique variation of TENCOR Enhanced Defect Detection Software (EDDS - CATS). This allows KLA / TENCOR / PROMETRIX P-16 to recognize and classify sub-micron defects as well as locally-affected features. This provides robust, repeatable and accurate defect evaluation and characterization. P-16 also includes a variety of user-friendly features which speed up the data analysis process for users. This includes a powerful sample tracking asset, wafer orientation capabilities, Python scripting, report templates, and data exportc functions. All components of KLA P-16 are designed for maximum reliability and long term repeat-ability, so users can feel confident in their findings. Overall, PROMETRIX P-16 model is the industry-leading wafer testing and metrology equipment, offering users a wide array of comprehensive and accurate data solutions. With its advanced detection and capture technologies, integrated sample area, and sophisticated defect detection software, TENCOR P16 provides businesses reliable and comprehensive insights into their wafer and die developments.