Used KLA / TENCOR / PROMETRIX Quantox 64100 #9281357 for sale

KLA / TENCOR / PROMETRIX Quantox 64100 is a wafer testing and metrology equipment designed for high-precision measurements of various features on semiconductor wafers. The system allows for simultaneous analysis of multiple planes and features, and provides quick turnaround time and easy automation for different production tasks. KLA Quantox 64100 is specifically engineered to measure tight process control parameters, such as line widths and pitches, etch depths, and deposition thicknesses. The unit has an integrated 3-dimensional (3D) noise-reduction software that eliminates the need for manual alignment and enables accurate results when measuring dense features. It is also built with optical metrology technology to help ensure consistently accurate metric results over a wide range of parameters. TENCOR Quantox 64100 is equipped with industry-leading signal-to-noise ratio (SNR) that delivers accurate measurements and minimizes errors while maintaining high throughput. The machine integrates a variable numerical aperture (NA) objective which means it can be quickly adjusted to measure small features, as well as arrays with several planes or overlapping features. Other features include a low-noise detector which delivers maximum accuracy, and a high resolution, high contrast image capture of features at different depths. Additionally, the tool utilizes innovations such as an enhanced beam path to improve measurement precision, and LED illumination which provides uniform illumination for more accurate measurements across the sample. PROMETRIX Quantox 64100 is also integrates a Dynamic Lens Compensator (DLC)and added lens scattered path (LSP) compensation technology, which provides long working distance and reduces abnormal light path phenomena. Additionally, the asset comes with an EDEN feature measuring software for automated, multi-dimensional feature recognition, which significantly reduces measurement time. Overall, Quantox 64100 is a reliable wafer testing and metrology model specifically optimized for applications requiring tight process control. With features such as advanced noise reduction, enhanced beam path, uniform illumination, DLC technology, and multi-dimensional feature recognition, this equipment delivers consistently accurate, high-precision results that meet the needs of today's high technology industry.