Used KLA / TENCOR / PROMETRIX RS-35 #9222692 for sale

ID: 9222692
Sheet resistivity mapping system.
KLA / TENCOR / PROMETRIX RS-35 is a cutting-edge wafer testing and metrology equipment. It is designed to rapidly process substrates and measure transistor die, providing repeatability, accuracy, and high throughput. KLA RS35 features a modular rotary shuttle architecture which expedites testing completion while minimizing exposure to damaging UV light. The shuttle moves the sample wafer around to the various test and metrology sites reserved for individual transistors. This design allows for rapid testing of many transistors in a single cycle. TENCOR RS 35's hardware components allow for superior control of process parameters such as temperature, humidity, and pressure. It is also equipped with advanced imaging hardware which provides high-resolution imaging of transistor die. This improves the reliability of testing results by providing reliable and accurate measurements. PROMETRIX RS35 is also equipped with a variety of software tools and programs that enable the system to quickly and accurately analyze and collect data from the transistor testing and metrology sites. These tools include an advanced defect diagnosis and detection unit, a flexible yield analysis program, and a comprehensive reporting machine. KLA / TENCOR / PROMETRIX RS35's reporting tool allows for detailed analysis of individual transistor die. It enables users to view detailed defect information, test results, measurement trends, and other data. This helps users to quickly identify the root cause of failure, assess the quality of the tested components, and optimize the yield of both test and production. Finally, TENCOR RS-35 includes a comprehensive suite of support services and applications, such as automated fail-safe modes, control subprocesses, and Wafer Mapper technology. These services help ensure efficient operation, secure data storage, and asset performance. Overall, PROMETRIX RS 35 is a highly advanced wafer testing and metrology model that provides superior test results, high throughput, and support services designed to optimize wafer yield. Its modular architecture, advanced imaging hardware, defect diagnosis and detection tools, and numerous supporting features makes it an ideal equipment for any application requiring fast and accurate testing of transistor die.
There are no reviews yet