Used KLA / TENCOR / PROMETRIX RS-35 #9284324 for sale

KLA / TENCOR / PROMETRIX RS-35
ID: 9284324
Resistivity mapping system.
KLA / TENCOR / PROMETRIX RS-35 is a high-precision wafer testing and metrology equipment that offers advanced metrology capabilities. This system provides on-wafer characterization, process control, and defect review and analysis, providing the most detailed and accurate analysis of wafers and devices available. It uses a state-of-the-art image acquisition unit to quickly capture 2-D and 3-D images, with up to 1000 x 1000 pixels. KLA RS35 automatically guides the operator through every step, and incorporates a high resolution optical machine with motorized stages, having scanning ranges of up to 10 cm. It is equipped with advanced algorithms to ensure automated feature identification and optimization during the scanning process. TENCOR RS 35 is designed to aid the development of high precision device features on semiconductor wafers, such as flat structures, line widths, step heights, and terrace structures. It is equipped with a range of metrology tools, including optical scatterometry and Fourier transform infrared spectroscopy, for more proper characterizations. The combination of these tools allows for a comprehensive visualization of the device under study, as well as for a very precise and accurate measurement of its various attributes. KLA RS-35 is further equipped with software tools for data analyzing, such as defect, image and parameter calculation, as well as all the necessary tools for data reporting and management. Its data analysis capabilities allow for the detection of defects and irregularities with a real-time 3-D product visualization. In addition, it can be connected to other KLA systems, allowing automatic program transfer and enhanced data synchronization. Overall, RS-35 is a highly advanced tool equipped with the latest technologies and resources in wafer testing and metrology. Its capabilities, accuracy and ease of use make it ideal for the analysis and development of high precision device features on semiconductor wafers.
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