Used KLA / TENCOR / PROMETRIX RS-35C #9293257 for sale

KLA / TENCOR / PROMETRIX RS-35C
ID: 9293257
Resistivity mapping system.
KLA / TENCOR / PROMETRIX RS-35C Wafer Testing and Metrology equipment is a powerful, high-precision, and fully-automatic tool used to evaluate the surface topology of semiconductor wafers. The system utilizes a variety of advanced optical, mechanical, and electrical measurements to provide detailed information on the wafer surface and its associated material properties. The probe and measurement head are high-precision tools capable of detecting even the slightest changes in topography and substrate quality. KLA RS-35C unit is capable of performing a variety of surface measurements and metrology services, including but not limited to surface roughness, contact angle, surface profile, surface slope, particle size, composition, surface finish, surface texture, and spark-discharge measurements. It also performs a variety of microscopic images, such as scanning electron microscopy (SEM), atomic force microscopy (AFM), and scanning tunneling microscopy (STM). Additionally, the machine performs defect detection, defect classification, and device geometries, as well as provides hardware comparison, characterization in global and local coordinates, 3D analysis, and 3D stitching. TENCOR RS 35C tool comes with a Raman spectroscopy option, which uses laser-induced fluorescence to detect various chemical species on the surface of a wafer. The asset also comes with a particle counter, which measures particle characteristics in terms of size, shape, and composition, as well as a contact angle measurement model. The latter uses an optical technique to measure contact angles between materials and liquids. RS 35C equipment is fully-automated and computer-operated, offering a range of advanced control and processing features. It is built on a modular architecture with flexible motion control components, allowing high precision and automated operations, enabling quick start-up times. It also features advanced analysis, digital image and signal processing, and a user-friendly interface that allows easy customization of the tool according to user needs and applications. RS-35C system provides repeatable and reliable measurements with unprecedented accuracy, repeatability, and reproducibility, making it an ideal tool for evaluating semiconductor wafer quality. Its flexibility and wide range of measurement and analysis capabilities make it a valuable tool for wafer-testing in a variety of industries, such as the semiconductor, automotive, aerospace, electronics, optical, and medical industries.
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