Used KLA / TENCOR / PROMETRIX RS-50e #119864 for sale

ID: 119864
Vintage: 1990
Resistivity Mapping System, 1990 vintage.
KLA / TENCOR / PROMETRIX RS-50e is a wafer testing and metrology equipment designed for semiconductor and opto-electronic device manufacturing. It is an automated platform that enables fast, accurate and robust semiconductor quality assurance testing. This system is suitable for a variety of applications, such as silicon wafer defect review, wafer edge imaging, overlay measurement and wafer mapping. KLA RS-50e unit is powered by a high-resolution color CCD camera and uses the latest technology for image processing and analysis. Its imaging machine provides high-speed imaging and can capture high-resolution images at fast scan rates. Its advanced onboard data acquisition technology combined with its powerful software algorithms allow for rapid data collection and analysis. TENCOR RS-50e is equipped with a range of advanced metrology and inspection tools that are designed to provide accurate and reliable measurements. These include electron backscatter diffraction (EBSD), light scattering diffraction (LSD), laser diffraction (LD), spectroscopy (S), selective-area electron diffraction (SAED) and Raman spectroscopy (RS). The tool is also capable of automated wafer-level defect inspection. RS-50e offers several features that facilitate efficient and reliable operation. These features include interchangeable ISER (integrated software and electronic resources), which can be tailored to the specific application. The asset also offers user-friendly software and user-specific patterns, allowing users to quickly and easily analyze and identify common wafer defects. PROMETRIX RS-50e's software has been designed to meet the most stringent performance and quality requirements. Its advanced algorithms enable high-speed image processing and analysis with low noise levels. The software also enables users to store and manage data, create reports and generate 3D views. Overall, KLA / TENCOR / PROMETRIX RS-50e is a powerful and reliable wafer testing and metrology model which is designed to meet the most demanding semiconductor and opto-electronic device manufacturing applications. Its combination of advanced imaging and inspection capabilities, ISER and user-friendly software make it an ideal solution for any wafer quality assurance testing.
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