Used KLA / TENCOR / PROMETRIX RS-55/TC #9238630 for sale

KLA / TENCOR / PROMETRIX RS-55/TC is a next-generation wafer testing and metrology equipment designed for high-throughput production test and inline measurement applications. This system offers advanced diagnostic capabilities in a cost-effective package, allowing manufacturers to take advantage of increased yield and better defect control. KLA RS-55TC unit's optical metrology head offers surface and thin-film measurements of test structures found on wafer surfaces and substrates. It supports a wide array of measurement techniques, including top-down and cross-sectional Fourier Transform Infrared (FTIR) spectroscopy, four-point probe, interferometry, darkfield imaging, stylus and probe-based techniques, and advanced single particle optical cell measurements. A selection of non-contact spectroscopic solutions are also available, including polarized light microscope (PLM), focused ion beam-scanning electron microscope (FIB-SEM) and atomic force microscopy (AFM). These techniques allow detailed inspection of various material properties such as surface roughness, crystal orientation, grain size, composition, and thermal stability, among others. The machine is highly automated, giving the user the ability to quickly and accurately measure many wafers in a single shot. The tool is equipped with a number of metrology modules, which makes it capable of performing simultaneous measurements, reducing the overall test time significantly without compromising accuracy. Additionally, TENCOR RS55/TC asset has powerful post-processing capabilities, which allow the user to quickly analyze the incoming data and generate detailed analysis reports. The model is also designed to interact seamlessly with other systems, facilitating the integration of test results from multiple test sources. Moreover, it can be programmed to carry out specific automatic test plans and allow remote scheduling of test procedures. KLA RS55/TC is an ideal choice for cost-effectively addressing most wafer testing and metrology requirements. With its exceptional performance, wide range of features and automated capabilities, it is well-suited for high-volume production test and inspection. It is an excellent choice for manufacturers who are looking for an advanced and reliable platform to maximize yield and reduce downtime.