Used KLA / TENCOR / PROMETRIX RS-55 #293628451 for sale

KLA / TENCOR / PROMETRIX RS-55 is a wafer testing and metrology equipment that provides high-definition imaging and analysis capabilities. The system operates by measuring the electrical properties of a wafer surface for high resolution imaging, defect detection, and measurement. The seven-micron laser beam on the unit uses a variety of established inspection techniques to analyze the characteristics of the samples, including optical/electrical measurements, microstructure imaging, and 3D profile metrology. KLA RS55 features an automated wafer testing and inspection process and supports both front-side and back-side measurements. Wafer samples are loaded into the machine and held in place with a vacuum chuck. The samples are then exposed to a seven-micron laser beam which measures their surface features and electrical properties. The laser scanning stage moves the sample between passes to ensure that the sample is scanned thoroughly. All the measurements are stored in a database to be accessed later on or used in further analysis. TENCOR RS 55 uses a proprietary dual-head configuration that helps to deliver fast and reliable analysis results. The tool offers fast 3D scanning to accurately measure the height, width, and other dimensions of the sample. This allows for more accurate defect detection and improved process control. The asset also features advanced optics to enable more detailed imaging and analysis of the sample. The model also incorporates an advanced defect imaging and analysis suite that uses high resolution optics and signal processing techniques to identify defects. The software suite includes tools such as automated defect localization, bird's-eye-view analysis, cross-section imaging, and image subtraction. KLA RS-55 utilizes advanced edge detection and image segmentation algorithms to enable faster, more efficient defect detection and analysis. The equipment also has a reliable, user-friendly workflow that is designed to enable rapid test and metrology without compromising accuracy. Finally, the system features on-board data analysis capabilities. This helps to reduce the time and effort required for data analysis and enables accurate data detection. All of these features combined make KLA RS 55 an ideal solution for wafer testing and metrology.