Used KLA / TENCOR / PROMETRIX RS-55TCA #9312456 for sale

KLA / TENCOR / PROMETRIX RS-55TCA Wafer Testing and Metrology Equipment is a high-end semiconductor metrology instrument specifically designed for accurate, reliable, and precisions measurement of wafer-level device structures on silicon substrates. It features a patented, high-resolution image processing system, state-of-the-art image processing, data handling, and analysis software, and a flexible and intuitive user interface. The unit provides automated metrology and wafer testing, allowing for rapid and accurate determination of high-precision wafer topography and device parameters. This enables accurate measurements of critical parameters such as film thickness, step heights, line widths, overlay, and others. It also features precise alignment and registration of measurements and wafers, automated inspections, and optical and electrical testing for silicon wafers. KLA RS 55 TCA machine can operate at high speeds in order to scan up to 16 full wafers within a single run. It also provides advanced imaging and analysis solutions with a variety of options ranging from edge profile detection to automated defect inspection. The tool is also capable of running concurrent sample pre-treatment processes, such as cleaning and curing. This allows for fast, accurate wafer tests, eliminating the need for manual operation and rework. The proprietary image processing algorithms provide excellent image contrast and sharp images for accurate measurement of wafer features. The asset is also easily upgradable, offering users the flexibility to upgrade their systems to the latest technologies in metrology. The advanced automation capabilities provided by the model enable users to reduce cost and time associated with device testing. TENCOR RS-55/TCA Wafer Testing and Metrology Equipment is a cost effective solution for wafer testing and metrology needs. It features an intuitive and easy-to-use user interface, robust data handling capabilities, and sophisticated automated processes. This makes it ideal for use in a wide range of industrial and research metrology and material testing applications, ranging from advanced device analysis of semiconductor structures to advanced failure analysis of MEMS devices.