Used KLA / TENCOR / PROMETRIX RS-75 #9163275 for sale

KLA / TENCOR / PROMETRIX RS-75 Wafer Testing and Metrology Equipment is a precision device for non-destructive testing, characterization, and metrology of materials in the semiconductor industry. This system provides high productivity by increasing throughput, accuracy, and automation. KLA RS75 is an automated non-contact unit that is capable of measuring a variety of physical properties of semiconductor materials, including dielectric constant, residual stress, layer thickness, void content, and surface roughness. The machine also provides comprehensive wafer testing capabilities through optimized algorithms and features such as linear scan control, scan synthesis, and 3D image scanning. The tool is equipped with a high-resolution camera asset and a precision measurement stage. The optical subsystem allows for the full-field measurement of wafers in a wide range of applications. TENCOR RS 75 also provides flexible tooling solutions for accurate testing and metrology over various sites. The model is controlled by Window-based PROMETRIX RS-75 software. This software is designed to allow easy data analysis from measurements. It also allows for efficient setup and calibration of scanning functions, and provides a comprehensive graphical user interface for full process control and data acquisition. RS-75 features the latest in 3D scanning technology, allowing for high speed and accuracy. It also offers various scanning strategies and multiple measuring options. TENCOR RS75 also provides precise and reliable wringer grade sorting answers. KLA / TENCOR / PROMETRIX RS 75 is the first of its kind and provides high performance and reliability, while providing an economical and cost-effective solution for semiconductor testing and metrology. It can be used to measure a variety of parameters, including dielectric constant, residual stress, layer thickness, void content, and surface roughness. TENCOR RS-75 Wafer Testing and Metrology Equipment is a reliable, innovative system for testing and metrology.