Used KLA / TENCOR / PROMETRIX RS-75 #9304703 for sale

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ID: 9304703
Resistivity mapping system With ME Board Power supply.
KLA / TENCOR / PROMETRIX RS-75 is a wafer testing and metrology equipment from KLA Corporation. It's a fully automated, user-friendly system, designed to meet the needs of semiconductor wafer manufacturers. KLA RS75 is capable of determining electrical parameters, such as resistance, capacitance, inductance, and voltage. It can also measure optical parameters, such as surface topography, surface profile, surface roughness, and surface profile. TENCOR RS 75 is a fully automated unit that is equipped with a robotic arm for loading and unloading wafers. It has a rigid, light-weight platform designed to minimize vibration and noise. The machine has an eight-axis alignment tool that ensures the wafer is precisely aligned with the measurement asset. RS 75 also has a data acquisition and signal processing module which continuously monitors the wafers to detect any surface features that could affect the measurement accuracy. KLA RS 75 is equipped with an integrated CCD camera and a high-resolution LCD monitor that enable the user to accurately observe the wafer surface for defect detection. As well, the model comes with an automated wafer size detection equipment which can accurately measure the diameter and the radius of any wafer. The system is designed to ensure accurate and repeatable measurements. It is equipped with a high-precision capacitive sensor for sensitive measurement and non-contact detections. The rugged and reliable design ensures consistent measurement results across a wide range of parameters. Additionally, the unit has a high-speed data transfer machine for efficient data integration. KLA RS-75 is designed for all levels of users from research scientists to technicians for accurate wafer measurement. It is equipped with the best-in-class technologies to provide reliable, repeatable and accurate wafer measurements. Its robust design is intended for long-term use in a harsh industrial environment.
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