Used KLA / TENCOR / PROMETRIX RS-35E Omnimap #9187374 for sale
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ID: 9187374
Wafer Size: 8"
Chuck, 8"
Flat monitor
Printer
Power conditioner
Hardware:
Vacuum: 300 mm Hg
Pressure: 50 psig (33 bar)
40 MB Fixed hard disk drive
3.5" Diskette drive, 1.44 MB capacity
Components:
386 SX Computer: 16 MHz
VGA Monochrome monitor
Dot matrix printer with buffer
PMX / Touch capabilities:
Trend charts
Ratio maps
Curve fitting
Data import and export
ASCII Copy to diskette
Measurement:
Contour, 3-D maps and diameter scans (up to 625 sites)
Quick tests: Standard and user definable tests (up to 30 sites)
Pattern tests (up to 1025 sites)
Data transfer:
Standard: SECSII Protocol data upload
Dual configuration switching
1.44 MB Floppy diskette
Manual included
Power requirements: 115 / 230V, <8 A, 50 / 60 Hz.
KLA / TENCOR / PROMETRIX RS-35E Omnimap is a wafer testing and metrology equipment designed for use in semiconductor production and fabrication. This system is capable of providing fast, accurate, and comprehensive analysis of a wafer's surface topography. The unit features an auto-focus and auto-exposure imaging machine, as well as automated multiple 3D measurements and high-resolution imaging. KLA RS-35E Omnimap is composed of three components: a stage, optical tool, and a asset controller. The model is designed with a large scanning stage and small footprint, making it an ideal choice for production line testing. The stage has a motorized drive equipment and is capable of scanning flat wafers with a precise linear velocity at a range of speeds. The system uses a combination of air bearings and a differential stage drive for optimal performance and accuracy. The optical unit consists of a high-resolution 3D confocal imaging head that enables automated surface mapping of aspherical features. It uses a patented high-resolution laser autofocus machine that ensures the highest precision and accuracy in surface measurements. A digital imaging tool provides high-resolution optical imaging with 4k pixel resolution, giving users the capability to visualize and analyze surface topologies with high detail. Finally, TENCOR RS-35E Omnimap is also equipped with a user-friendly asset controller which features a graphical user interface and powerful software. This software includes capabilities for multiple 3D measurements, as well as tools for data visualization, analysis, and reporting. PROMETRIX RS-35E Omnimap is designed to provide reliable and accurate measurement of a wafer's surface topography. It features automated multiple 3D measurements and high-resolution imaging, making it an ideal choice for advanced wafer testing and metrology. This model is perfectly suited for semiconductor production and fabrication, and will ensure the highest precision and accuracy in surface measurements.
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