Used KLA / TENCOR / PROMETRIX SM 300 #293766761 for sale

KLA / TENCOR / PROMETRIX SM 300 is a high-end wafer testing and metrology equipment designed for the most precise semiconductor inspection and analysis. Capable of measuring complex semiconductor structures and devices with high levels of accuracy and precision, the system is designed for analyzing microelectronic devices ranging from small-scale resistors and capacitors to large-scale memory devices, integrated circuits, and more. KLA SM 300 utilizes the most advanced optical imaging technology to analyze and measure semiconductor structures, providing clear and detailed imaging with unmatched accuracy and precision. This is achieved by the highly sensitive 4-Axis scanning unit which allows for the resolution of surface features down to 0.1 microns. The machine also utilizes a proprietary edge detection algorithm to improve the effectiveness of edge recognition and image segmentation. TENCOR SM 300 is equipped with a powerful suite of metrology and analysis tools. These include an AL-cut metrology tool to measure thru-Silicon-via (TSV) structures and a wide angle metrology tool which can be used to analyze advanced interconnect structures, such as advanced fan-out Technology (AFOT). Other metrology and analysis tools include photometric imaging and die-to-die comparison capability. PROMETRIX SM 300 is extremely flexible and can be tailored to fit specific applications and individual needs. For example, the tool can be configured with a variety of scanning and measurement optics to provide the most accurate data for complex device structures and advanced technologies such as TSV structures. In addition, the entire asset is designed to be integrated with other equipment and lab automation, making it even more versatile and efficient. SM 300 is the perfect choice for advanced semiconductor inspection and analysis. With its high levels of accuracy, precision, and flexibility, the model is capable of meeting the most demanding requirements for wafer testing and metrology.