Used KLA / TENCOR / PROMETRIX SpectraMap SM 300 #9284326 for sale

KLA / TENCOR / PROMETRIX SpectraMap SM 300 is an advanced wafer inspection and metrology equipment. The system offers a comprehensive suite of high-precision surface measurement, imaging, film thickness, and packaging inspection capabilities. It is designed to measure a range of wafer attributes, including geometry, electrical properties, film integrity, and surface topology. KLA SpectraMap SM 300 uses advanced digital imaging and optical scanning techniques to create highly accurate images and measurements of a wafer's surface, with a resolution of up to 0.2 microns. It features a variety of measurement modes, including volumetric mapping, backscattered electron imaging (BEI), X-ray transmittance imaging (XTI), and scanning electron microscopy (SEM). This unit can detect a wide range of manufacturing defects, such as microscopic cracks, scratches, grains, and other imperfections. The machine also offers powerful film thickness and package inspection options. These include film thickness mapping, package flatness, stencil printing, die attach, bumping, and solder balling, among others. With these advanced inspection capabilities, TENCOR SPECTRAMAP SM300 provides manufacturers with the ability to detect and identify even the most difficult-to-detect defects. The tool's advanced software suite allows for streamlined operation and rapid data processing. This helps manufacturers to quickly and accurately analyze wafer surface data and make the necessary adjustments to achieve optimal results. Additionally, the SM 300 offers a wide range of connectivity options, including Ethernet, USB 3.0, RS232, and GPIB, making it easy to integrate into existing production lines. SPECTRAMAP SM300 is a powerful wafer inspection and metrology asset. It provides precise measurements of wafer surfaces, films, and packaging, and can detect even the most difficult-to-detect defects. This makes the model ideal for high-precision production applications.