Used KLA / TENCOR / PROMETRIX UV 1050 #293600853 for sale

KLA / TENCOR / PROMETRIX UV 1050 is a wafer testing and metrology equipment designed for semiconductor manufacturers who need quality control and process monitoring for photolithography and wafer testing processes. It combines automated metrology, defect review and yield analysis capabilities in a single platform, providing a comprehensive solution for both process development and quality control applications. KLA UV 1050 employs laser technology and a patented laser autofocus system to measure critical dimensions with superior accuracy and part-to-part repeatability. It incorporates spectrophotometric analysis for precise color measurements and is capable of detecting minor differences in reflectance. Moreover, the unit has the ability to measure features down to small geometries and large clearances with a high degree of precision. TENCOR UV-1050 also features an enhanced user interface that provides an easy-to-use data entry machine and an intuitive graphical user interface (GUI) which facilitates rapid operation. This tool reduces measurement time and eliminates errors associated with manual data entry. In addition, the asset has powerful defect review capabilities, enabling operators to generate detailed defect reports and quickly identify variations in the wafer. PROMETRIX UV 1050 is a cost-effective alternative to traditional expensive single-wavelength systems, offering extended performance and simplified maintenance. Moreover, it can integrate with external systems, enabling automatic alignment and focus control, plus long-term process monitoring and analysis. It is equipped with an advanced feature extraction algorithm which enables real-time analysis of motifs and specialty shapes. In addition to its wafer testing and metrology functions, the model is designed to facilitate overlays and provide e-beam inspection capabilities. It offers sophisticated in-situ analysis for identifying and diagnosing process variations related to overlay performance. This feature helps ensure the quality of device-substrate interactions and the overall accuracy of the semiconductor device. All of these capabilities, combined with UV 1050's high-speed scanning capabilities, enable applications requiring high-end performance to be completed quickly, accurately, and cost-effectively. They make KLA UV-1050 an ideal choice for anyone seeking reliable and precise wafer testing and metrology solutions.