Used KLA / TENCOR / PROMETRIX UV 1050 #293683730 for sale

KLA / TENCOR / PROMETRIX UV 1050 is a wafer testing and metrology equipment that provides accurate, high-resolution imaging, rapid post-test analysis, and critical feature detection. This system is designed to handle challenging applications such as defect location, overlay alignment, and process monitoring in a wide range of process extremes. It offers extremely quick throughput for prompt feedback, by leveraging its high speed Laser, wafer singulation and full imaging Automation. KLA UV 1050 has a state-of-the-art optical unit, including a light guide that allows even lighting conditions across the entire wafer field and the latest High Q laser that ensures the highest performance. TENCOR UV-1050 also features an advanced stage machine and a small spot size of 5 µm, providing superior imaging and metrology accuracy, even in tight patterns. UV 1050 also features an integrated motorized z-slide, equipped with an auto depth of focus and an auto-diagonal correction. The z-slide provides fast, accurate movements and can be adjusted up to 20µm, enabling alignment and positioning of high resolution wafers. In addition, the tool uses the innovative Auto-Slide singulation and wafer mapping technology, which increases throughput and reduces human errors. UV-1050 also boasts an array of advanced contamination control features, such as automated cleaning and mitigation of minute particles and steam enrichment, which protect the wafers during imaging for quality and effective wafer monitoring. TENCOR UV 1050 also includes advanced software suites, including automated defect analysis, tool maintenance and data recording, a comprehensive web-based reporting asset, and a job tracking model. Custom-made reports and digital diagrams in multiple languages are available. Overall, KLA UV-1050 is an advanced wafer testing and metrology equipment designed to meet the needs of process control, yield management, and critical feature inspection of challenging applications. Its quick throughput, reliable image acquisition, advanced contamination control, and comprehensive software packages make it a comprehensive solution for wafer testing and metrology.