Used KLA / TENCOR / PROMETRIX UV 1050 #293811723 for sale

ID: 293811723
Film thickness measurement system Stage resolution: xy - 0.25µm, z - 0.025µm Imaging system: color camera Operating system: Windows NT.
KLA / TENCOR / PROMETRIX UV 1050 is a wafer testing and metrology equipment designed for high-precision dimensional analysis of semiconductor wafers. It is a versatile, high-performance system that provides fast and accurate measurements with repeatable results. The unit works by using a combination of optical, interferometric and motorized scanning techniques to analyze wafer features. Specifically, it utilizes a near-infrared laser light source for diffraction measurements, interferometry to measure tiny features, and a motorized scanning stage for larger features. The laser light source emits a broad spectrum of light, which is then focused through a series of apertures and lenses. It is ultimately focused onto the wafer surface. This light creates a pattern of interference that is then used to measure the shape and size of the structures found on the wafer surface. The machine also comes equipped with a low coherence interferometer that is used to measure microscopic features such as pits and steps. This interferometric measurement is based on the principle of phase shifting: the light being reflected off of the feature is measured and compared to the starting phase. The difference in the two values is proportional to the feature's actual size. Finally, the tool includes a motorized scanning stage, which allows for larger features to be accurately measured. The scanning stage moves the sample in a controlled manner, while taking multiple measurements and combining them to obtain more accurate results. All three of these measurement techniques combine to provide a comprehensive analysis of wafer features, enabling users to determine shape, size, location, surface topography and more. KLA UV 1050 is capable of measuring features down to 5 nano-meters in size, enabling it to analyze the most challenging of wafers. In addition to its superior measurement capabilities, the asset also offers a range of benefits. It is equipped with a robust motion control model that provides rapid scanning and high accuracy, making it suitable for high-throughput measurements. It also has a closed-loop air bearing stage that ensures the sample is stable, helping to reduce errors and improve accuracy. Overall, TENCOR UV-1050 is an advanced wafer testing and metrology equipment that provides a fast and reliable way of analyzing semiconductor wafers. With its combination of optical, interferometric and motorized scanning techniques, it is an ideal choice for a range of applications.
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