Used KLA / TENCOR / PROMETRIX UV 1050 #9284331 for sale

KLA / TENCOR / PROMETRIX UV 1050 is a wafer testing and metrology equipment with high-end precision and accuracy that enables highly detailed analysis of wafer surfaces. This system is designed to allow users to achieve highly precise measurements on complex surfaces with the capability to inspect contours and profiles for mapping and other analysis. The unit is equipped with a powerful Class 1 UV-1000 scanning laser source and a proprietary Class 1™ Optics Analysis machine to provide the highest level of performance available. This, combined with a high-resolution optical tool, ensures the most accurate readings while scanning wafer surfaces. KLA UV 1050 has outstanding resolution and accuracy, allowing for the detection of even the smallest features on a surface. It is capable of both imaging and metrology scanning for a wide range of applications, including high-resolution mapping and 3D contour measurement. The scanning head of TENCOR UV-1050 has a 20-axis staging asset and a unique tilt and rotate module that enables the inspection of even the most challenging surfaces. This allows users to inspect the entire wafer surface and accurately target areas both large and small. The user interface is intuitive and straightforward, allowing users to quickly become familiar with the controls needed to operate the model efficiently. Users can create and store their own advanced process recipes or utilize the extensive database of pre-loaded recipes stored onboard. For high throughput and increased accuracy, the equipment supports several advanced automation capabilities including multi-leveling, auto-focusing, and probes. By integrating these features, the system can maximize throughput and accuracy while increasing the speed of data collection. In conclusion, PROMETRIX UV-1050 is an advanced wafer testing and metrology unit that offers outstanding performance and precision. It's advanced automation features and intuitive user interface make it an ideal choice for those looking to maximize their throughput and accuracy while reducing data collection time.