Used KLA / TENCOR / PROMETRIX UV 1050 #9377287 for sale

KLA / TENCOR / PROMETRIX UV 1050 is a wafer testing and metrology equipment that uses advanced ultraviolet (UV) imaging technologies to evaluate semiconductor wafers for defects, flaws, and non-uniformities. The system combines precise, high-speed full-wafer imaging with a low light intensity source to detect minortopographical irregularities across the entire wafer. The primary imaging component of the unit is an 8x full-field, digital imaging camera with driver-controlled magnification range (from 3X to 40X). It can capture both surface and edge contour data to identify surface features as small as 0.5 micron in width. The camera also enables color imaging for easy feature identification. Additionally, the machine supports process monitoring by automatically detecting the presence of surface features on the wafer substrate. The tool features a patent-pending UV imaging technology that improves defect characterization and imaging resolution by improving wafer throughput while reducing light energy requirements by 10-15 times. The UV imaging asset provides information on the analysis of the smallest defects that can affect the performance of the semiconductor device. The model also enables users to perform a variety of metrology measurements, including topographic measurements of surface and pattern uniformity, resistance measurement for failure analysis, substrate uniformity measurements, and groove depth (for understanding design issues). The equipment also includes a suite of advanced software packages for the analysis, presentation, and archiving of data. Advanced software is designed for digital image processing, 3-D surface mapping, defect review, data comparison, and inspection automation. An intuitive graphical user interface simplifies routine operation and data visualization, allowing the user to easily analyze and present data. In summary, KLA UV 1050 is a highly advanced wafer testing and metrology system that packs powerful, UV imaging technology into a compact design. It offers ultra-high resolution surface imaging, enhanced defect detection and characterization capabilities, metrology applications for process monitoring, and software packages for data analysis, presentation and storage. This unit is ideal for semiconductor manufacturers who require a powerful and reliable tool to ensure quality performance.