Used KLA / TENCOR / PROMETRIX UV 1050 #9402299 for sale

KLA / TENCOR / PROMETRIX UV 1050
ID: 9402299
Wafer Size: 6"
Film thickness measurement system, 6".
KLA / TENCOR / PROMETRIX UV 1050 is a state-of-the-art wafer testing and metrology equipment specifically designed to meet the demands of the semiconductor industries. The system provides advanced characterization capabilities, enabling the user to quickly and accurately analyze the performance of integrated circuits, photonic devices, MEMS and other micro-electronic components. High speed, high accuracy and non-destructive testing are at the heart of KLA UV 1050's unmatched performance. Using an ultraviolet laser source to excite wafers in the 254-368 nanometers range, the unit can detect very small defects and perform the testing at high speeds. The machine also provides an imaging option to allow access to detailed information at the circuit level. This allows for the detection of minute defects, which would otherwise be undetectable. With this option, users are able to observe fault isolation, circuit mapping and a wide range of other features. The tool includes an automated mapping asset, which allows for the detection of local defects in a given area of the wafer. Additionally, the model includes a three-dimensional surface scan which can provide an analysis of the surface area of the wafer. This enables users to visualize the topography and determine any irregularities which need further investigation. TENCOR UV-1050's metrology capabilities have been enhanced to support a variety of measurement types. These include critical dimension measurements, critical area measurements,and overlay measurements. The equipment also offers defect analysis capabilities which include defect detection, sizing and grading, as well as defect review. UV 1050 is capable of fast, non-destructive wafer testing and metrology. It boasts a highly sensitive ultraviolet laser source, advanced imaging capabilities and automated mapping tools. Its advanced capabilities allow it to swiftly measure and analyze the performance of semiconductor circuits, providing the user with a comprehensive view of their results. The system is designed to meet the stringent demands of the semiconductor industry, making it an ideal choice for those seeking both speed and precision.
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