Used KLA / TENCOR / PROMETRIX UV 1250 #9284318 for sale

KLA / TENCOR / PROMETRIX UV 1250 equipment is an advanced tool for wafer testing and metrology. It combines the latest in optical and electronics technologies to provide a comprehensive analysis solution for challenging semiconductor applications. KLA UV 1250 is a full-field optical metrology system capable of inspecting across the entire wafer at once. Utilizing a high-resolution back-illuminated CCD camera, the unit captures both one and two-dimensional images of samples, providing accurate analytics at the nanometer level. It also features three-dimensional z-axis imaging and reliable phase shift measurement capabilities, as well as a 3D particle detection machine that can be used to alert users of potential particle defects. The tool includes a wide array of additional features to enable advanced wafer testing and metrology. It is equipped with a host of automated algorithms, including gray-scale pattern recognition, critical defect detection, overlay analysis, and failure analysis. With integrated KLA software, users can automate routine tasks and product-specific testing to reduce test time and increase throughput. In addition to wafer testing and metrology, TENCOR UV 1250 is also versatile for other applications, such as general-purpose imaging and optical asset inspection. The model is able to acquire, analyze, and store detailed megapixel images of samples, with precise pixel resolution and full-size photos without distortions or artifacts. It also comes with an efficient interface to enable fast data acquisition and interactive feedback while integrating with other automated testing systems. These features combine to make UV 1250 an essential tool for wafer testing and metrology. Its precision accuracy and wide range of features make it capable of acquiring detailed images of challenging semiconductor applications, while the automated algorithms and integrated software ensure efficient and effective analysis of any sample. The equipment's versatility makes it suitable for a host of applications, from wafer testing to general-purpose imaging, making it one of the leading solutions for any semiconductor-related need.