Used KLA / TENCOR / PROMETRIX UV 1250SE #9095212 for sale

KLA / TENCOR / PROMETRIX UV 1250SE (1250SE) is a wafer testing and metrology equipment designed specifically for semiconductor manufacturers. It is a highly efficient and advanced system that can provide rapid wafer matching, making it a valuable tool for industries requiring high performance and accuracy. The 1250SE is a highly modular and customizable wafer testing unit. The automated testing and metrology machine is designed to revolutionize the reliability and throughput of wafer testing. The tool is a step change in wafer performance, measuring a wide range of parameters allowing for a wealth of information to be accurately and rapidly sorted and processed. The 1250SE is designed to detect a variety of defects through its optimization of measurement parameters. The asset enables users to customize each test to their desired result, identifying defects such as foreign matter, contaminants, line topology, flatness, and more. The 1250SE utilizes an advanced particle optics model, which enables users to analyze defect and distortion patterns in a variety of ways. This makes the equipment unique to many other models, as it allows for an increased number of measurements in the same amount of time. The 1250SE also enables up-to-date analysis of sophisticated problems that can occur with current wafer technologies. The system can detect paticle debris, thin film crack, bumps, and dielectric surface defects, all at the same time. This is possible through its combination of auto-correction and analysis algorithms. These algorithms provide users with high accuracy of measurement results. In addition, the 1250SE is equipped with a dual-staged precision stage and enhanced semiconductor imaging technology. This combination of features provides excellent image acquisition capabilities to facilitate wafer and die scanning of 2D, 3D, QFN, multi-layer, and CSP. The dual-staged precision stage also facilitates high-resolution inspection of the entire die and allows for the analysis of non-flat features. The 1250SE is an ideal choice for semiconductor manufacturers that demand reliable, accurate, and timely measurements. The unit's powerful optics engine, high-end imaging capabilities, advanced test algorithms, and dual-staged precision stage make it an ideal choice for any wafer testing application. Whether it's detecting small-scale defects or large-scale features, the 1250SE provides the user with reliable results in a matter of minutes.