Used KLA / TENCOR / PROMETRIX UV 1250SE #9161753 for sale

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ID: 9161753
Thin film measurement system Missing parts: SE Detector Filed illumination shutter UV Cutoff filter Currently warehoused.
KLA / TENCOR / PROMETRIX UV 1250SE is a state-of-the-art wafer testing and metrology equipment for the semiconductor industry. Its advanced capabilities include precision measurement of physical properties, defect analysis, film thickness measurement, and defect localization. KLA UV-1250SE is equipped with a powerful ultraviolet laser source, allowing for the accurate measurement of high-density patterned layers, as well as smaller layers and features. It can also measure grain size distribution in the material, as well as other physical characteristics. Laser interferometry provides precise height, tilt, and figure measurement of a variety of surface materials. TENCOR UV 1250 SE also offers additional capabilities such as automated defect review and SPC (Statistical Process Controls). The system is designed to detect and quantify flaws in wafers, and its defect area images are produced in just seconds. Its defect localization capabilities allow users to pinpoint each defect's location and size. The unit utilizes the most advanced metrology and imaging systems for highest resolution imaging. Nanometer positional accuracy is available with the highest magnification and accuracy. The machine also features a Dual-Port scanning tool that enables measurements at multiple points within a single surface. For automation and optimization, PROMETRIX UV 1250SE features a comprehensive scripting language as well as an advanced user interface. This allows automation of complex processes and customization of user-level functionality. The asset also offers a wide range of data output options and data storage capabilities. UV-1250SE is an ideal choice for semiconductor manufactures, offering exceptional performance as well as long-term reliability. The model's exceptional precision and comprehensive features make it an ideal choice for a variety of wafer inspection and metrology applications.
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