Used KLA / TENCOR / PROMETRIX UV 1250SE #9307745 for sale

KLA / TENCOR / PROMETRIX UV 1250SE is a high-precision wafer testing and metrology equipment designed to provide measurements with the highest degree of accuracy at maximum throughput in the shortest amount of time. The system is capable of performing automated inspection, metrology, and defect review processes of both conventional and 3D structured wafers. The unit features a 12" x 12" high resolution, low linear energy transfer scanning optical head with a large field of view and stage travel capabilities. This helps to increase the throughput rate and ensures immaculate image quality with optimal resolution. Additionally, the dedicated optics module is built into the head to eliminate external intrusions and ensure the best light signal capabilities. KLA UV-1250SE also includes a dynamic, programmable LED-based brightfield illumination, as well as oblique angled darkfield illumination. This helps to accurately capture the full 3D structure of the wafer, as well as detect minor defects with ease. Additionally, the machine is capable of detecting a wide range of defects including semiconductors, bubbles, pits, scratches, polishing residues, and stress fractures. It also features an advanced defect review process that uses optical software to provide superior background subtraction and contrast levels for fast and accurate wafer data evaluation. TENCOR UV 1250 SE is also designed to be easy to use, requiring minimal maintenance and setup time, and tool parameters can be adjusted easily for a wide range of applications. The asset is built to maintain its performance over time and is equipped with a number of advanced features for added security, including an automatic shutoff function in the event of a power failure. Overall, PROMETRIX UV 1250SE is an advanced, user-friendly wafer testing and metrology model with the capability to deliver accurate results with minimal setup time. The equipment is suitable for pre-emptive maintenance applications, as it helps to detect minor defects quickly and accurately, while also increasing throughput rate and reducing costs.