Used KLA / TENCOR / THERMA-WAVE 45-014824 #293672012 for sale

KLA / TENCOR / THERMA-WAVE 45-014824 wafer testing and metrology equipment is designed for quick and accurate wafer measurement. It boasts an automated, robust system that quickly and conveniently scans wafers for critical dimensions, pattern geometries, edge parameters and steps. This unit has the ability to measure flat wafers as well as curves and raised bumps. KLA 45-014824 machine provides a comprehensive tool that is capable of accurately measuring a variety of different features on semiconductor wafers. It utilizes a grayscale camera to take two-dimensional (2D) interference images, which are then used to measure critical dimension (CD) parameters. It also employs a laser pattern recognition asset to identify and measure groove parameters. The model also has the capability to measure step heights. The equipment is equipped with a user-friendly interface and various display options to provide convenience and reliability when taking measurements. Additionally, the system offers data analysis features, such as CD statistical analysis. It also comes integrally mounted on a four-axis wafer stage, allowing for automated steps during measurement. TENCOR 45-014824 is designed for fast and reliable measurements with overlapping fields of view for simultaneous measurements from multiple tips. Its dynamical interaction control technology eliminates vibrations and environmental drift, aiding in consistently reliable measurements from wafer to wafer. The unit utilizes a high-voltage FEE circuit that ensures repeatable CD measurements regardless of small-scale pattern variations. The machine is equipped with various features to ensure accurate measurements, such as a repeatability monitor with a closed-loop feedback. Automated routines are provided to quickly and conveniently measure wafers, and a recipe library is included for creating custom measurement scripts. Additionally, the tool has an open architecture so it can integrate with various metrology tools for feature recognition and data integration. Overall, THERMA-WAVE 45-014824 is an advanced wafer testing and metrology asset designed to efficiently measure wafers for multiple parameters and features. The model offers industry-leading performance, throughput and accuracy, and is easily integrated with other metrology tools. It is the perfect choice for wafer inspection and testing in advanced semiconductor fabrication and production applications.