Used KLA / TENCOR / THERMA-WAVE FX 200 #9211045 for sale

KLA / TENCOR / THERMA-WAVE FX 200 equipment is a sophisticated wafer testing and metrology system that is optimized for precise and accurate measurements of wafer devices. This unit has a high-sensitivity digital signal processor that allows it to scan for defects as small as 20 nanometers, while its multi-axis optical head configuration is optimized for high throughput performance. In addition, the machine's precision motion encoding technology enables automated probes to precisely position probes to sample various locations on the wafer. KLA FX 200 is equipped with a range of automated testing solutions and a choice of measurement probes to suit different testing and metrology requirements. It features an autofocus tool configured to align the probe with the wafer surface in order to accurately measure the surface topography. The autofocus asset also includes digital image processing algorithms designed to compensate for any variance in the sample's height and orientation. The model includes a number of advanced testing and metrology tools, including high-speed optical inspection, burn-in testing, RF transmit and receive capabilities, and thermal analysis. It supports a range of wafer types such as logic, DRAM and SRAM, EPROM, and bipolar devices. In addition, it features a range of analysis parameters, including current, voltage, timing, and capacitance, for further characterization of the device. The equipment also provides support for various industry-standard software and other programming languages, making it easy to integrate into existing manufacturing lines. TENCOR FX 200 offers comprehensive data display and analysis capabilities, allowing users to review and interpret measurement results. The system also has an intuitive user interface designed for easy navigation and can be operated in a standalone configuration or connected to a central data management unit. It has an automated fault diagnosis machine that detects and reports any faults or issues during measurement operations, helping ensure product quality and yield. In addition, THERMA-WAVE FX 200 tool offers fast, accurate, and consistent measurements for process control and quality assurance. It enables testing of electrical parameters on hundreds of wafers simultaneously and provides rapid feedback to help reduce cycle time. This asset is equipped with alarm indicators to alert operators to potential issues, and a range of motion control options to suit different applications. Overall, FX 200 model enables manufacturers to perform extremely accurate and consistent wafer testing and metrology. Its high-sensitivity digital signal processor, multi-axis optical head configuration, and automated probes provide reliable and repeatable performance, while its various testing and metrology tools enable users to characterize and inspect devices precisely. With its scalable design, intuitive user interface, and automated fault diagnosis equipment, this system offers manufacturers a comprehensive solution for wafer testing and metrology.