Used KLA / TENCOR / THERMA-WAVE FX 200 #9236721 for sale

KLA / TENCOR / THERMA-WAVE FX 200 is a state-of-the-art wafer testing and metrology equipment that provides precise and accurate measurements of wafer surface shape, thickness, and topography. By utilizing its advanced sensors and optical systems, these measurements can be done quickly and effectively. KLA FX 200 implements unique technologies such as "Automatic Wafer Profiling", "Three Plane Slice Measurement", and "Gaze Interference" which enable the system to accurately analyze surface defects, wafer curvature, and other properties with up to an accuracy of 0.5 nm. Furthermore, TENCOR FX 200 is equipped with an automated wafer handling unit that enables seamless automation of the testing and metrology process. THERMA-WAVE FX 200 includes advanced algorithms that are capable of detecting various types of surface defects and other anomaly signals. The machine is able to scan the entire wafer surface to accurately detect attractive defects such as hillocks, pitting, and crystal misorientation with extreme accuracy. It can even detect and measure extremely fine surface features such as pinholes, finite edge lines, and other subtle features. In addition, the tool is able to perform multiple acquisitions quickly and efficiently due to its powerful optical asset and advanced algorithms. This allows customers to perform on-site real-time inline production with significantly decreased downtime and improve product quality. FX 200 model is capable of both non-contact and contact measurements. It uses intense light sources to accurately measure the surface features of the wafer with extreme precision. Furthermore, the equipment is equipped with a user-friendly graphical user interface that is capable of providing detailed graphical information regarding the testing and metrology of the wafers. This makes the system easy to use for both professionals and inexperienced users. KLA / TENCOR / THERMA-WAVE FX 200 unit is the ultimate solution for wafer testing and metrology. Its combination of cutting-edge features and accurate results allow researchers and manufacturers to accurately and quickly monitor and analyze wafers in an efficient and cost-effective manner.