Used KLA / TENCOR / THERMA-WAVE OP 2600 DUV #9214772 for sale
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KLA OP 2600 Deep Ultraviolet (DUV) Optical Profiler is a wafer testing and metrology equipment designed to measure critical surface characteristics of optoelectronic devices. It features a high-resolution automated optics system to generate a wide range of surface measurements with a precision up to 0.5nm and a repeatability of 0.2nm. The unit uses a laser scanning microscope, powerful software, and the advanced TENCOR microscope stage to provide an accurate view of the surface of the devices under test. KLA / TENCOR / THERMA-WAVE OP 2600 DUV has a resolution of up to 3µm with a field of view up to 600µm. This machine offers both bright-field imaging and dark-field scanning which can be used to measure surface topography at multiple magnification levels. The microscope can measure both small features and large features with its variable illumination settings. Additionally, KLA OP 2600 DUV has a 3-D contour mapping feature to precisely measure dimensions and features typically inaccessible to traditional microscopes. In addition to the advanced microscopy capabilities, TENCOR OP 2600 DUV optical profiler is capable of doping segregation measurements and electrical performance measurements such as current-voltage curves, emission spectra, and contact resistance. It also offers a variety of additional functionality, including optical metrology and characterization of nanoscale devices and features. THERMA-WAVE OP 2600 DUV tool is designed to be intuitive and easy to use. Its intuitive user-interface allows for control of all its features. Its large touchscreen display allows quick and easy access to all of the asset's power features. Furthermore, the model comes with a comprehensive user manual and a library of applications to ensure fast, reliable use. OP 2600 DUV optical profiler is a cost-effective and versatile wafer testing and metrology equipment. It offers a comprehensive view of devices under test and enable reliable performance measurements. The system's powerful software capabilities, advanced optics unit, and user-friendly interface position it as a capable tool for testing the range of devices used in the optoelectronics industry.
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