Used KLA / TENCOR / THERMA-WAVE OP 2600 #293766853 for sale

KLA / TENCOR / THERMA-WAVE OP 2600 is a wafer testing and metrology equipment. The system is designed to analyze product wafers and monitor processes. It offers a combination of optical profilometry, scatterometry, and scanning electron microscopy (SEM). KLA OP 2600's optical profilometry utilizes an infrared beam optics unit to obtain 3D topography measurements from any angle of incidence. This data is used to generate high resolution topology images and quantitative profiles. The machine can accurately measure roughness, step heights, grain size, and other surface characteristics. The scatterometry module of TENCOR OP 2600 is designed for optical appearance characterization of wafers and other objects. The tool has outstanding photometric accuracy which is essential for critical performance evaluation. It provides accurate measurements of angles, colors, pattern defects, scratches, haze, and other surface defects. The scanning electron microscopy module of THERMA-WAVE OP 2600 provides micro-scale imaging and analysis. Its electron optics asset enhances image resolution and detail. The module can be used to measure grain size, particle contamination, and porosity. It also allows users to inspect 3-D surfaces of wafers in both topdown and cross-sectional modes. OP 2600 also has a low-emission model that reduces air contamination. It enables long uninterrupted operation without having to shut down for maintenance or decontamination. The equipment also has intuitive software that allows operators to move rapidly through different test and measurements procedures with minimal startup time. Overall, KLA / TENCOR / THERMA-WAVE OP 2600 is a powerful and versatile wafer testing and metrology system. Its combination of optical profilometry, scatterometry, and scanning electron microscopy enables accurate and detailed analysis of wafer surfaces. Its low-emission unit and intuitive software enables long and efficient operation with minimal downtime.