Used KLA / TENCOR / THERMA-WAVE OP 2600B #9383636 for sale

KLA / TENCOR / THERMA-WAVE OP 2600B is a leading wafer testing and metrology equipment that provides a thorough measurement of the electrical and thermal characteristics of semiconductor devices on a single platform. The system offers a range of metrology, thermal test, and laser etching capabilities for electronics fabrication, packaging, and integration. This unit offers precise, non-destructive testing of wafers and other materials without having to damage or compromise the integrity of the track patterns. KLA OP 2600B takes advantage of infrared spectrometry (IR) to measure physical properties of silicon wafers, such as topography, thickness, and roughness. The machine can also be used for etching the wafers to create electrical connections, as well as performing electrical tests and analog measurements. Additionally, TENCOR OP 2600B offers the ability to detect defects, contamination, and other irregularities by analyzing a wide range of sources, including infrared, X-ray, and ultraviolet spectrophotometry. The tool is highly compatible with a variety of other wafer metrology tools and can be configured to interact with them in a seamless and automated manner. It features a touch panel controller and an intuitive software interface that make operation simpler and reduce the risk of user error. Furthermore, THERMA-WAVE OP 2600B has comprehensive diagnostics and reporting capabilities for optimized accuracy and repeatability during testing and metrology operations. The asset is equipped with advanced thermal optics systems for accurate thermal profiling of wafers. With OP 2600B's data-acquisition speed and heating rate capability, precise measurements can be taken to ensure maximum efficiency. It also features a laser auto-align option for highly reliable etching processes. In addition, this model offers precise vibration isolation from environmental factors to reduce noise interference and ensure accurate results. Overall, KLA / TENCOR / THERMA-WAVE OP 2600B offers versatile, reliable, and accurate testing and metrology capabilities. By providing comprehensive reports and high-precision measurements, it can help organizations perform flawless quality checks on their wafers and semiconductor devices.