Used KLA / TENCOR / THERMA-WAVE Optiprobe 2600 #9212840 for sale

KLA / TENCOR / THERMA-WAVE Optiprobe 2600 is an advanced wafer testing and metrology equipment which enables high precision measurements of fluctuations in electrical properties on the surface of a wide variety of semiconductor wafers. This system is designed to automate the measurement process, making it much more efficient and accurate than manual inspection with manual microscopes. KLA Optiprobe 2600 is equipped with an embedded vision unit which helps to simplify the operation process and gives better results. TENCOR Optiprobe 2600 is comprised of three modules: the Imaging Module, the Tester Module, and the Measurement Module. The Imaging Module has a CCD camera for imaging and inspecting the surface of the wafer for defects. The Tester Module has a testing chamber which is capable of providing various electrical tests from multiple sub-tester locations simultaneously. The Measurement Module is an integrated measuring solution that comprises all the necessary components for efficient and accurate testing and metrology operations. THERMA-WAVE Optiprobe 2600 platform is also equipped with KLA WINTEST software which allows users to automate the testing process. WINTEST software can be used to set the machine parameters, to control the testing process, to analyze measured data, and to configure multiple testing setups. Moreover, Optiprobe 2600 is designed to be fully compatible with the industry-standard TENCOR S2K software, enabling customers to use the same software in different areas. KLA / TENCOR / THERMA-WAVE Optiprobe 2600 is designed to deliver accurate results, with a high precision measurement resolution of 0.02 µm. It is capable of testing a variety of wafer types, including single-, double-, and multi-layer wafers. Additionally, KLA Optiprobe 2600 is suitable for process and qualification monitoring in the most demanding production environments for surface profile testing and metrology. TENCOR Optiprobe 2600 provides the highest performance in wafer testing and metrology. It maximizes the efficiency of testing and metrology operations, while providing reliable and accurate measurements. The tool is ideal for probers, process engineers, and other semiconductor professionals looking for a streamlined and effective method of inspecting wafers.