Used KLA / TENCOR / THERMA-WAVE Optiprobe 2600 #9364392 for sale

KLA / TENCOR / THERMA-WAVE Optiprobe 2600 is a state-of-the-art wafer testing and metrology equipment that offers the most advanced wafer analysis and measurement capabilities available. KLA Optiprobe 2600 uses patented laser technology to enable accurate, noncontact measurements and analysis of semiconductor wafers ranging in diameter from 100 mm to 300 mm. With a wide variety of tests and measurements available, the system allows users to inspect each wafer at the feature, transistor, and integrated circuit level. The onboard laser technology enables TENCOR Optiprobe 2600 to detect a wide range of surface features including wafer defects, particle contaminants, resistivity, surface roughness, and electrical properties. This in-situ analysis gives users the ability to quickly and accurately identify process parameters that are critical to wafer fabrication. In addition, the unit lets users determine the thickness of gate oxides, contact metallization, photoresist layers, and other materials during process development or troubleshooting. Optiprobe 2600 is equipped with a software-controlled scanning head that can move the laser across the wafer in a variety of patterns, allowing users to precisely follow complex paths across the wafer surface and measure detailed feature-level parameters. Its high-resolution camera machine also enables users to make accurate visual inspection of the wafer surface. This combination of measurement and imaging capabilities makes THERMA-WAVE Optiprobe 2600 an invaluable tool for process development, yield optimization, and wafer characterization. KLA / TENCOR / THERMA-WAVE Optiprobe 2600 offers top-of-the-line wafer test and metrology capabilities in a compact, easy-to-use platform. It is designed to meet the strict requirements for accuracy and reliability, making it the ideal choice for quality assurance, process monitoring, and cost reduction initiatives. With its wide range of features and capabilities, KLA Optiprobe 2600 is the ideal wafer test and metrology solution for today's most advanced semiconductor fabrication operations.