Used KLA / TENCOR / THERMA-WAVE Optiprobe 2600 #9407880 for sale

KLA / TENCOR / THERMA-WAVE Optiprobe 2600 is a state-of-the-art wafer testing and metrology system that enables engineers to quickly and precisely measure and analyze features on a silicon wafer for accuracy and repeatability. KLA Optiprobe 2600 features robust hardware, superior optics, and advanced algorithms to give users an unparalleled level of accuracy and repeatability in wafer testing. TENCOR Optiprobe 2600 employs an advanced optical microscope to enable operators to acquire images of features on silicon wafers. This tool is used to measure the exact positions and sizes of the features on the wafer's surface. Optiprobe 2600 also utilizes patented multi-track profiling technology that allows operators to quickly identify and analyze arbitrary dimensions and depths of features with highest precision. This also makes it possible to accurately measure wafer height, angle and surface condition. THERMA-WAVE Optiprobe 2600 comes with several advanced controllers to enable users to automate the wafer testing process. These controllers help users collect multiple data points on a single wafer and allow them to store this information in a database. This allows them to compare the results of different wafers and optimize their testing process. KLA / TENCOR / THERMA-WAVE Optiprobe 2600 also facilitates accurate monitoring of the experiment to ensure that the performance parameters are being maintained. For data analysis, KLA Optiprobe 2600 is equipped with a graphical user interface that automates the process of correlating data from multiple wafers and mapping them to various characteristics. This makes it easy to compare wafers across multiple layouts. The user interface is also equipped with advanced algorithms that allow operators to analyze precise patterns that characterize the presence of defects and irregularities in the wafer. TENCOR Optiprobe 2600 is specifically designed to maximize mission critical performance and throughput of wafer testing and metrology in the manufacturing process. This makes it highly reliable and cost-effective in meeting the precise requirements of semiconductor manufacturers.