Used KLA / TENCOR / THERMA-WAVE OPTIPROBE 2600B #9200135 for sale

ID: 9200135
Film thickness measurement system.
KLA / TENCOR / THERMA-WAVE OPTIPROBE 2600B is a wafer testing and metrology equipment designed for the highest levels of precision semiconductor testing and automated metrology. It combines numerous technologies, such as video and optics, to accurately measure the characteristics of a semiconductor wafer and its associated components. The system also has the capacity to perform non-destructive evaluations, meaning that the wafer under test is not damaged during the process. The unit's OptiFlex Architecture can be adapted to customer needs; it can be configured with over 15 different modules that vary from high-resolution video inspection to micro-processing of electrical defects. KLA OPTIPROBE 2600B's extended-field video machine allows for up to 100X magnification which provides high-resolution imaging and cross-sectional analysis of wafer characteristics at a nanometer-level. It can also map and identify corrosion, seeds, small particles, liquids, cracks, bumps, and features of the device in a variety of applications including defect-based inspection and 3D shape measurements. TENCOR OPTIPROBE 2600B is able to measure the electrical properties of the devices on the wafer as well as physical characteristics such as thickness. Its high-precision optical technology achieves a resolution of up to one nanometer, with repeatable measurements and no impact to the wafer integrity and quality. In addition, the tool is able to quickly compare measured data to engineering drawings and on-wafer "fingerprints" to identify any discrepancies. The asset also offers automated surface profilometry, which gives high-resolution surface measurement capabilities to capture height and shape. This can be used to monitor the wafer production process, helping to improve efficiency and ensure that devices meet critical size and shape requirements. For testing and data analysis, the model is equipped with KLA WAVE map software, which is an integrated metrology suite of software tools. This provides easy-to-use features to analyze the collected data and create measurement reports. These reports are an essential part of a quality control process and are used to make decisions about a batch of wafers and to ensure they meet design and performance specs. Additionally, the equipment offers full data control and configuration features, giving users the ability to easily change system parameters such as test frequencies and measurement ranges. This allows for custom testing and data generation activities, enabling the unit to be used for research and development. In conclusion, THERMA-WAVE OPTIPROBE 2600B is a powerful wafer testing and metrology machine that combines multiple technologies for high-precision semiconductor testing. With its wide range of customizable modules and integrated software, as well as data control and configuration options, the tool is an invaluable tool for both production quality control and product development.
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