Used KLA / TENCOR / THERMA-WAVE OPTIPROBE 2600B #9399074 for sale

KLA / TENCOR / THERMA-WAVE OPTIPROBE 2600B is an advanced wafer testing and metrology equipment designed for in-line metrology for semiconductor wafers and devices. It is an integrated system that combines non-contact spectrophotometric 3D analysis and inline metrology, enabling industry-leading measurement accuracy, high throughput, and reliability. KLA OPTIPROBE 2600B is built on KLA proprietary micro-spectroscopy technology, which allows measurements to be made at various angles, depths, and angles-of-view. This ensures the highest accuracy and repeatability of the results, as well as enhanced wafer navigation and image manipulation features. TENCOR OPTIPROBE 2600B's innovative 3D mapping feature maps the profile of the wafer in nanometer-level accuracy, providing three-dimensional information to precisely quantify 3D shape, density, and etching results. The unit also supports multi-angle measurement, which is useful for determining the volumetric performance of devices and structures. THERMA-WAVE OPTIPROBE 2600B also supports a variety of metrology techniques, such as reflectance spectroscopy, digital interferometry, scanning and non-linear spectroscopy, and fluorescence spectroscopy. It also provides advanced defect detection and classification capabilities, including automated defect detection and classification, custom wafer recognition, multi-wavelength metrology, and x-ray radiation analysis. Another key feature of OPTIPROBE 2600B is its sophisticated operational software, which includes data analysis capabilities, programmable workflows, and secure networking options. The machine also offers an extensive range of reporting and data export options, so users can access their results promptly and efficiently. Overall, KLA / TENCOR / THERMA-WAVE OPTIPROBE 2600B is a cutting-edge wafer testing and metrology tool that offers industry-leading accuracy, speed, and reliability, making it an invaluable tool for the semiconductor industry. Its ability to map the profile of the wafer in nanometer-level accuracy, along with its reliable defect detection and classification capabilities, make KLA OPTIPROBE 2600B an ideal solution for fast, accurate, and reliable wafer testing and metrology.