Used KLA / TENCOR / THERMA-WAVE TP 630 #293636352 for sale

KLA / TENCOR / THERMA-WAVE TP 630 is a wafer testing and metrology equipment manufactured by KLA and TENCOR. This state of the art system offers a unique combination of advanced multi-sensor technologies and intelligent production control features. It is specifically designed for semiconductor fabrication and research applications. KLA TP 630 is a fully automated unit with a built-in CCD detector, an automated mechanical sample-handling machine, and an intelligent software suite. It offers an extensive range of metrology capabilities, ranging from single-sensor measurements to sophisticated multi-sensor, multi-dimensional analysis using advanced algorithms. It also features a unique multi-site sample-handling module and precise motion control for precise positioning of substrates and samples on the sample stage. TENCOR TP 630 employs the latest advances in IEEE-1394 digital imaging technology and advanced signal acquisition, processing, and analysis technologies. The tool is capable of measuring various electrical and optical properties of semiconductor materials, including thin film, topography, and nanostructure characterization. It offers a range of metrology capabilities, from simple electrical and optical measurements to complex, multi-dimensional analysis. The multi-sensor asset of THERMA-WAVE TP 630 is capable of measuring a wide variety of properties, such as surface area, thickness, resistivity, and dielectric constant. The model is also capable of analyzing samples through multiple sampling areas to accurately analyze complex structures. It can be configured with a variety of probes, wafer frames, and probe cards suitable for different applications. TP 630 also offers high resolution imaging capabilities, providing detailed 2D and 3D images of semiconductor materials. This equipment is ideally suited for measuring, inspecting, and analyzing various geometrical shapes and parameters of the materials. It can be used in process monitoring and characterization of material dynamics, such as temperature, dry etch processes, or electron beam lithography. KLA / TENCOR / THERMA-WAVE TP 630 provides unparalleled performance and accuracy, and can be integrated with data acquisition and analysis systems for maximum productivity. The advanced design and features of this system ensure accurate results, even under extreme process conditions. Its powerful software suite enables engineers and scientists to quickly and accurately analyze their data and make more informed decisions.