Used LEITZ LIS #293598594 for sale

LEITZ LIS is an advanced wafer testing and metrology equipment developed by Nikon Metrology that helps semiconductor manufacturers reduce the cost, complexity, and time required for testing and measuring their products. It combines the power of a high-resolution laser interferometer and advanced imaging technology to provide manufacturers with the required performance and accuracy. LIS system consists of a highly sensitive laser interferometer that measures the surface of a wafer in 3D with an accuracy of up to 0.1 nanometers. The laser interferometer is used to accurately measure the maximum surface profile of the wafer, as well as its deviations or micro-strucural features. The imaging unit captures an image of the wafer surface at an elevated magnification of up to 5000x, uncovering any defects, flaws and anomalies that cannot be seen by conventional optical microscopy. The imaging technology provides the customer with a highly detailed representation of the wafer's surface, allowing them to identify any potential problems and take corrective action, if needed. LEITZ LIS also offers a comprehensive metrology package that is designed for analyzing various aspects of the wafer's geometry, such as surface roughness, linearity, straightness, parallelism and angularity. Additionally, the machine can be used to examine potential stress and strain patterns on the wafer or chip, as well as the refractive index of substrates and the oxide layer on the wafer. LIS is an easy-to-use and comprehensive tool that has the potential to revolutionize the wafer testing and metrology industry. It offers high precision, repeatability and accuracy, as well as an integrated analysis solution that allows manufacturers to quickly identify any potential flaws and anomalies, reducing manufacturing time and cost. LEITZ LIS is an ideal solution for semiconductor manufacturers looking for a reliable and advanced wafer testing and metrology asset.