Used MDC CSM/16 #9410485 for sale

MDC CSM/16 is a wafer testing and metrology equipment designed to provide reliable, high-precision measurements of wafers of various sizes and materials. This device is capable of measuring a range of parameters related to wafer electrical, physical, and chemical characteristics. The CSM/16 is equipped with an automated text recognition module, allowing for precise readings of etched or printed text present on the surface of the sample. The system is equipped with an integrated three-axis, air-bearing knife-edge wafer measurement stage and an advanced AutoGage scanner. The stage is designed for precise wafer placement in order to accurately measure the parameters. The AutoGage scanner utilizes a linear variable displacement transformer (LVDT) for ultra-precise detection and measurement of the sample's surface topography. The CSM/16 also offers a patented Fully-Automated Metrology Unit (FAM), which is capable of automatically measuring various properties such as critical dimensions, profile radius, flatness, texture, angle, and film thickness. This machine is integrated with a vision module and high-resolution linear sensors, offering precise measurements without the need for manual intervention. Furthermore, the CSM/16 offers a high-resolution imaging tool, allowing users to analyze and measure die-to-die patterns, as well as to identify defects or degraded areas. This imaging asset is equipped with a digital camera, a fluintesent imaging domcile, a laser light source and a vision processor. MDC CSM/16 includes an optical microscope feature, which features digitally-stitched images with high-resolution capability and a range of levels of magnification, allowing operators to focus precisely on quality control or inspection objectives. It is capable of intensifying images, providing a higher level of contrast and resolution. It also incorporates an advanced composition analyzer module which uses energy dispersive x-ray spectroscopy (EDS) to assess the composition and concentration of elements present in the sample. In terms of its control software, the CSM/16 offers a user-friendly graphical user interface (GUI). This program allows for easy operation of the model, providing access to measurement commands files, setup menus, and online help. The GUI also enables the user to compute, save and display the measured data. Overall, MDC CSM/16 is a comprehensive wafer testing and metrology equipment for reliable electrical, physical and chemical analysis of wafers. It incorporates advanced features such as the FAM, integrated imaging system and optical microscope, enabling users to achieve precise and accurate measurements. The device also offers ease of use with its friendly GUI, allowing users to set up and operate the unit with ease.