Used MDC ECM 98 PL #293618598 for sale

MDC ECM 98 PL is an advanced wafer testing and metrology platform designed for use in semiconductor device quality control. The machine provides automated one-of-a-kind measurement and analysis, and is capable of handling a wide range of wafer product, from MEMS to advanced logic. MDC ECM 98PL equipment features an automated in-line configuration for fast throughput. It can manage up to 98 wafers per level, with up to four levels per system, resulting in a total throughput of 392 wafers per hour. This unit is designed to support a variety of test configurations, including photo-electronic and electrical tests, as well as a variety of metrology measurements, such as CD/thickness, stress, optical scanner, and etch depth. The machine contains multiple test and metrology modules, which work together to provide fast, reliable results. It offers a wide selection of measurement heads, including single- and multi-channel options. The multi-channel measurement heads offer the advantage of simultaneously measuring different parameters at the same time, allowing for more efficient test and measurement solutions. The tool also features an advanced vision-guided robot, which accurately locates and samples wafers for tests. ECM 98 PL asset offers a number of helpful features for high throughput testing. It includes a Defect-Marker Program that can rapidly detect tiny defects and perform precise analysis, as well as a Wafer Verification Model for precise identification and tracking of wafer products. Additionally, the Data Storage Unit provides convenient storage and retrieval of test data, allowing users to quickly find the information they need. The equipment also features advanced software, designed to streamline test and metrology operations. It provides intuitive control options, as well as a comprehensive suite of analysis tools and data interpretation capabilities. This software is also compatible with many industry-recognized test programs and feature extraction algorithms, providing robust data analysis capabilities. Overall, ECM 98PL provides an advanced wafer testing and metrology platform, designed to handle complex tests in a fast and reliable environment. It provides a comprehensive suite of hardware, software and analysis tools to enable comprehensive test and metrology operations. Most importantly, it provides the performance and accuracy necessary for today's demanding semiconductor device quality assurance operations.