Used SEMILAB SSM2000 #293661704 for sale

SEMILAB SSM2000 is an advanced wafer testing and metrology equipment designed for semiconductor device research and development. It provides top-of-the-line automated waferSize testing, metrology and defect detection capabilities. SEMILAB SSM 2000 is capable of both electrical and optical measurements on metal/semiconductor samples. The system provides flexibility and a wide range of features for a broad range of customer requirements. SSM2000 utilizes a superior waferSize testing automation architecture to ensure accuracy and reliability. Its advanced automation functions allow the unit to automatically select the best test recipe, adjust testing parameters, and select combination of measurement configurations for optimal performance. Additionally, the machine includes a highly accurate linear XYZ Motor Scanning Unit (MSU) for non-contact testing. SSM 2000 also offers optical metrology capabilities with an automated focusing tool for high-resolution accurate measurements. The asset's integrated optical-imaging and camera functions provide fast and accurate defect detection. SEMILAB SSM2000 has an integrated fiber-optic-interrogation model that can be used to measure doped and un-doped regions. SEMILAB SSM 2000 is designed for maximum flexibility and scalability with upgradeable modules and customizable software to support a broad range of customer requirements. The equipment features a variety of data acquisition tools such as user-defined statistical analysis, data reporting processes, and trend analysis. It also includes an intuitive user interface, customizable software, and a wide range of other features. Overall, SSM2000 offers the highest performance and accuracy to ensure extremely reliable test and metrology results for semiconductor device research and development. This system provides users with an efficient and reliable platform for automated waferSize testing, metrology, and defect detection.