Used VEECO / SLOAN DEKTAK 150 #293643666 for sale

VEECO / SLOAN DEKTAK 150 is a wafer testing and metrology equipment designed to measure surface features on semiconductor wafers. It is configured for optimal performance in the inspection and metrology of current and future generations of integrated devices. The system is built up on an XYZ positioning stage with stiffer travel, low friction bearings and higher step resolution allowing for precision measurements. VEECO DEKTAK 150 utilizes advanced optical design for achieving the highest resolution, with the ability to measure features down to 1.5nm. The higher resolution is made possible by using a greater amount of light from a larger source and collecting it through improved optics. At the heart of SLOAN DEKTAK 150 is its powerful integrated software package. A variety of software modules have been developed to allow the unit to instrument a large array of test structures, with powerful scripting capabilities to allow for automated tasks. The software can even determine the edge of a sample automatically, thereby eliminating the need for tedious manual measurements. DEKTAK 150 also comes with an array of accessories, including an extender arm which extends the scanning range, probes, I/O controllers and multi-meters to maximize performance. VEECO / SLOAN DEKTAK 150 machine is also capable of sampling up to 5 wafers simultaneously, making it ideal for testing and analysis of large numbers of wafers from production runs. It features an automated environment that allows for accurate and consistent results across the board by providing temperature and humidity control in the metrology chamber. The performance of VEECO DEKTAK 150 makes it a ruthless tool for defect detection and characterization, enabling engineers to quickly evaluate device surfaces for uniformity and for the presence of scratches and corrosion. It is also a great tool for evaluating wafer strength and reliability, as its high-resolution capabilities allow for the most accurate measurements across a variety of processes. Overall, this wafer testing and metrology tool is a reliable and cost-effective solution for the evaluation of semiconductor wafers.