Used VEECO / SLOAN DEKTAK 150 #293808885 for sale

VEECO / SLOAN DEKTAK 150 is a multi-functional wafer testing and metrology system designed for semiconductor characterization. It can simultaneously measure the height, surface texture, and various electrical properties of semiconductor wafers. VEECO DEKTAK 150 utilizes a proprietary scanning force microscope design to measure the physical characteristics of semiconductor wafers. It uses a low-force, high-resolution cantilever probe to measure the heights of uniform or non-uniform topographical features with micron-scale resolution. It can also characterize surface texture with a resolution as small as 5 nanometers. The scanning force microscope can be used to measure the wrinkles, pits, peaks, and other physical surface features of the wafer. SLOAN DEKTAK 150 also includes a suite of electrical characterization measurements. Its four-point probe turret allows for the measurement of sheet resistance, contact resistance, and surface potentials on a wide range of wafer types. It includes a capacitance scanner for measuring capacitance-voltage and capacitor equivalent series resistance. DEKTAK 150 also includes an electrical parameters characterization system that uses microprobes to measure device parameters in static or dynamic mode. VEECO / SLOAN DEKTAK 150 is supported by a feature-rich software package that allows users to accurately analyze and document their results quickly and efficiently. Its intuitive interface also allows users to visualize their measurements in various ways. The software assists users in quickly evaluating wafer-level process metrics, such as noise, gain, and breakdown. Users can also customize their own analysis scripts to streamline their workflows. VEECO DEKTAK 150 is an ideal tool for quality assurance teams, research institutions, and engineering laboratories. Its configurability and multi-functional capabilities enable accurate assessment and optimization of process development cycles. It can perform both physical and electrical characterization measurements simultaneously, allowing users to quickly develop and refine their process parameters. The software package makes data collection and analysis easy and efficient, aiding the efficient execution of experiments.