Used VEECO / SLOAN DEKTAK 150 #293812945 for sale
URL successfully copied!
Tap to zoom
VEECO / SLOAN DEKTAK 150 is a state-of-the-art wafer testing and metrology equipment designed to measure and analyze semiconductor samples. This highly accurate system is equipped with a 2mm x 0.2mm optical encoder, which delivers precise scanning of surfaces up to 150mm in diameter and can accurately measure microstep movements with repeatability of 1.8 angstroms. VEECO DEKTAK 150's powerful monochromatic optical microscope provide superior imaging capabilities and is able to detect features of as small as 10 nanometers with ease. The microscope is capable of both bright field and dark field imaging, allowing users to scan and analyze testing samples in both normal and inverted forms. SLOAN DEKTAK 150 features a 10nm resolution XY sample stage, allowing for precise probing and measurements of the sample's X-Y coordinates. This stage can also operate in a laser lift-off mode that can precisely measure the depth of layered samples with repeatability of ± 2nm. In addition to its powerful optical microscope, DEKTAK 150 is also equipped with an integrated AFM/MC-AFM sensor capable of performing observation and measurement of nanoscale features. This specialized sensor uses Atomic Force Microscopy (AFM) to measure features as small as 0.5 nanometer, allowing scientists and engineers to accurately measure samples, such as adhesion forces, local stress, surface roughness, and electrical properties. VEECO / SLOAN DEKTAK 150 is an advanced unit designed to suit the needs of today's semiconductor and thin-film industries. Equipped with a host of measurement, imaging, and analysis components, this machine provides detailed data and analysis that can help streamline processes and improve product quality. The user friendly and intuitive interface makes it easy to learn and operate, further helping manufacturers to optimize their processes.
There are no reviews yet