Used VEECO / SLOAN DEKTAK 150 #9358452 for sale

VEECO / SLOAN DEKTAK 150
ID: 9358452
Surface profiler.
VEECO / SLOAN DEKTAK 150 is a wafer testing and metrology system. It is designed to measure the flatness and thickness of a wide variety of thin film substrates including semiconductor wafers. It is a highly accurate, precise, and repeatable wafer testing and metrology system, making it ideal for use in the semiconductor industry. VEECO DEKTAK 150 features a scanning tunneling microscope (STM) sensor, which uses an extremely thin cantilevered beam in order to measure nano-scale surface features on a wafer. The STM sensor is composed of a high-sensitivity nanoscale cantilever, a very low noise amplifier, and digital signal processing. This advanced array of components offers very high sensitivity and accuracy, allowing for very precise measurements with consistent results. SLOAN DEKTAK 150 is capable of measuring both flatness and thickness of the wafer. The flatness measuring mode allows for surface shape analysis of the wafer, the mode being capable of detecting subtle variations in the flatness of the wafer being tested. The thickness measuring mode allows for the precise measurement of wafer thickness, the measuring range capable of being configured to accommodate a wide range of wafer thicknesses from hundreds of nanometers thick up to tens of millimeters thick. DEKTAK 150 also offers a wide range of data measurement and analysis capabilities. It allows for a range of profile types and display formats, as well as data collection and global analysis functions. The product also includes a convenient graphical user interface for easy operation. VEECO / SLOAN DEKTAK 150 offers a number of user-friendly features which makes it an ideal choice for wafer testing and metrology. It offers highly accurate results due to its advanced STM sensor, it has a wide range of data measurement and analysis capabilities, and it includes a convenient user interface for easy operation. These features ensure VEECO DEKTAK 150 is one of the best wafer testing and metrology systems available.
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