Used VEECO / SLOAN DEKTAK 3 #293600237 for sale

VEECO / SLOAN DEKTAK 3 is a high-precision wafer testing and metrology system for the analysis of thin films and surfaces. It provides accurate and repeatable measurements of wafer surfaces in terms of local step heights, total step heights and mean film thickness results. It has a range of specialized optical components and software tools to give the most accurate and comprehensive results. VEECO DEKTAK 3 has a range of optical components to analyze wafer surfaces. It uses an interferometer configured with Darkfield or Brightfield LED Illumination to obtain highly accurate average and local thickness results. To measure local step heights and profile, SLOAN DEKTAK 3 utilizes Contour Reflectron Mapping which has sub-nanometer resolution capability. DEKTAK 3 also has Scanning Electron Microscope which provides users with a maximum magnification of up to 300X and a monochromatic imaging capability. This enables measurements of very small features with great detail. The software of VEECO / SLOAN DEKTAK 3 offers a wide range of features to aid in the accurate analysis of wafer surfaces. It enables users to generate reports and statistics such as step height, distance, and feature size. The software also has powerful post-processing algorithms to reveal hidden features of wafer surfaces. It is also equipped with an interactive graphical user interface which allows users to review results in an intuitive way. The user can also enter offset and threshold-based measurement criteria which gives the user full control to customize the analysis. For further data analysis, VEECO DEKTAK 3 has an advanced graphical analysis option which can analyze data in various formats including 2D profiling images, X-Y charts, and surface plots. SLOAN DEKTAK 3 is designed to be user friendly, efficient and reliable. It is extremely lightweight and highly accessible making it ideal for use in wafer testing and metrology labs. It comes integrated with a variety of hardware and software options making it suitable for a range of thin film and wafer applications. The system can also be calibrated and adjusted easily allowing users to get the most accurate and repeatable results. DEKTAK 3 is an ideal tool for those looking for an efficient and reliable way to analyze thin film and wafer surfaces.