Used VEECO / SLOAN DEKTAK 3 #9176254 for sale

ID: 9176254
Surface profiler.
VEECO / SLOAN DEKTAK 3 is a wafer testing and metrology equipment that is used in industries such as semiconductor wafer manufacturing, lithography, packaging, and various other related industries. It is designed with the latest technology advancements and enables users to obtain extremely accurate and precise readings, such as surface roughness, step height, and stressing of wafers. The system is composed of two main components, the Dektak table and the probe. The table provides a base on which wafer samples or parts are placed for scanning. The probe is then moved along the wafer surface to allow accurate and precise measurements of height, width, depth, and surface roughness. VEECO DEKTAK 3 features touch probe heads that utilize capacitive technology to produce reliable contact testing for various shapes and sizes. An adjustable set of linkages accommodates different probe lengths and flexible connection cables give the probe greater flexibility of movement. A specialized position servo mechanism is also included to provide for precise linear and vertical motion of the probe. Other features of the unit include an integrated position encoder with accuracy of 0.5 microns, adjustable electron optics, and built-in software for compiling and graphing test results. SLOAN DEKTAK 3 also offers unique options for analysis beyond the typical traits talked about above. The machine includes an advanced curved film measurement option which can calculate in-plane displacement and thickness of curved films on wafer surfaces. Additionally, a geometrical survey option is available to map wafers for comparison with specifications or test samples. DEKTAK 3 is a fast, reliable, and accurate tool for testing and metrology of wafers in the semiconductor and related industries. With its combination of advanced technology, adjustable features, and specialized analysis options, VEECO / SLOAN DEKTAK 3 is a perfect choice for those needing precise and accurate wafer testing.
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