Used VEECO / SLOAN DEKTAK 3 #9192441 for sale

ID: 9192441
VEECO / SLOAN DEKTAK 3 system is a versatile platform for wafer testing and metrology. Featuring an innovative design with robust touch-and-feel functionality, built with best-in-class engineering, VEECO DEKTAK 3 offers a durable and reliable tool for measuring surface topography and roughness. The system comes with features such as an integrated workstation, a built-in microscope, and a programmable or manual control station. Its flexible design allows it to handle a variety of wafers sizes, ranging from 2 to 12 inches in diameter. For enhanced accuracy, SLOAN DEKTAK 3 is equipped with a micropositioning stage and integrated encoder, enabling it to provide precise measurements. This advanced stage technology allows for sub-micron resolution. It also includes a digital image correlator for profile measurements and an analog readout displaying the film thickness. DEKTAK 3's integrated workstation features a powerful microprocessor and software package. This includes software tools such as the Vector Profile, which allows for the acquisition of 300,000 data points with a dynamic range of 20nm to 50μm. The software is also capable of advanced graphic output to measure advanced parameters such as skid deformation and path angle non-uniformity. Additionally, VEECO / SLOAN DEKTAK 3 has integrated analysis software for surface profile measurement and bas Relief measurements, as well as contour analysis and basic plotting tools. For enhanced reliability, VEECO DEKTAK 3 has built-in temperature compensation, drift correction, and a micro-rotation stage. It also has integrated beam deflection that helps ensure consistent probe coverage and dimensional measurement accuracy. The system also has a notching feature, which allows for quick and easy pattern recognition. With its comprehensive features and versatile design, SLOAN DEKTAK 3 is an ideal platform for wafer testing and metrology. Its user-friendly technology and accurately measuring capabilities makes it perfect for any research or industrial application requiring high-precision measurements.
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