Used VEECO / SLOAN DEKTAK 3030 ST #9383773 for sale

VEECO / SLOAN DEKTAK 3030 ST is a wafer testing and metrology equipment designed for the accurate characterization of semiconductor materials. This system is capable of non-contact, three-dimensional (3D) measurements of semiconductor wafers with nanometer-scale precision. VEECO 3030ST unit utilizes solvent-free diamond tipped stylus probes, allowing for reliable measurements over a wide range of surface topologies and features. SLOAN DEKTAK 3030ST is designed with an XYZ scan head, allowing for the 3D mapping and characterization of wafer surfaces. The scan head is equipped with a nanomanipulative tip compensation algorithm that increases the accuracy of wafer metrology by ensuring a constant tip-surface contact through the entire range of surveyed surfaces. 3030ST uses a closed-loop scan machine that allows for rapid, high-precision measurements with a velocity of up to 10 mm/sec. VEECO / SLOAN DEKTAK 3030ST has a number of built-in features that make it a reliable metrology tool for a variety of applications. These include a laser interferometer for sub-nanometer surface metrology, a backside illumination asset to detect and analyze wafer surface defects, and a fully motorized stage for automated wafer loading and unloading. Additional features include a pressure regulator and a strain gauge assembly for measuring contact force, an air-bearing table to ensure stability during scanning, and adjustable compliant head suspension to reduce vibration. VEECO DEKTAK 3030 ST model is compliant with a number of industry protocols and standards. This includes G46, E14, and MM17 for high-accuracy thin film measurements, as well as FOB and BEETEK for analysis of backside defects. The equipment is also compliant with Wyko wafer mapping software, allowing users to analyze mapping data in a variety of graphical formats. SLOAN 3030ST is an efficient and reliable wafer testing and metrology system that is designed for a range of measurements and analysis protocols. This unit is equipped with numerous features, allowing users to analyze wafer surfaces with nanometer-level precision and accuracy. DEKTAK 3030 ST is compliant with a variety of industry standards, enabling users to access a Comprehensive suite of software tools for data processing and analysis.