Used VEECO / SLOAN DEKTAK 3030 #293590373 for sale

VEECO / SLOAN DEKTAK 3030 is a powerful and reliable wafer testing and metrology equipment designed to provide complete and accurate measurements of the profile and thickness of various substrates. Specifically, this system has been designed for precision metal and semiconductor applications, and it is capable of accurately measuring very thin metal films, such as those used in MEMS applications. VEECO DEKTAK 3030 utilizes a unique scanning probe microscope (SPM) technique which allows for environmental scanning measurements with nanometer resolution. This unit is capable of measuring across a very wide range of linear and 2D dimensions. The measurement accuracy is maintained over a large area and SLOAN DEKTAK 3030 is able to maintain a level of stability across the surface of the specimens. The hardware and software systems are robust and reliable, making it possible to maintain consistent repeatable results on all samples. Other standard features of DEKTAK 3030 include a large direct drive sample stage, a high-precision probe, an autofocus machine, an advanced motor positioning tool, and a comprehensive data acquisition and analysis suite. The large sample stage enables quick, accurate navigation of the surface of the specimen and consistent repeatability is maintained even throughout complex curves. The high-precision probe measures with a high degree of accuracy and can measure everything from large features down to nanometer-scale features. At the same time, the autofocus asset is able to track surface topography in order to maintain accuracy even when the surface of the specimen varies. The advanced motor positioning model also enables quick and accurate repositioning of the equipment and specimen. Finally, the comprehensive analysis suite provides comprehensive analysis of the measurements recorded. Overall, VEECO / SLOAN DEKTAK 3030 is an excellent choice for applications that require precise, accurate measurements of metal or semiconductor substrates. This system's advanced hardware and software suite allows for the accurate measurement of very thin films and nano-scale features. At the same time, the large direct drive sample stage, robust motor positioning unit, and autofocus machine ensure quick, hassle-free measurements. The overall tool makes VEECO DEKTAK 3030 an ideal choice for demanding wafer testing and metrology applications.